1. Silicon Wafer Internal Crack Inspection
Silicon is optically transparent in the short-wave infrared spectrum. Pairing the Computar M5018-SW lens with an InGaAs SWIR camera allows factory automated inspection systems to perform sub-surface imaging on fast-moving solar cells and silicon ingots.
Problem SolvedIdentifies internal micro-cracks, inclusions, and structural defects that are completely invisible under visible light. The lens's low -0.3% optical distortion ensures spatial calculations and crack lengths are registered with extreme geometric accuracy.
Silicon Wafer InspectionSub-surface Crack DetectionInGaAs Camera AlignmentPhotovoltaic Quality ControlSWIR Imaging
2. High-Throughput Moisture Sorting in Agriculture
Water has a strong absorption peak at 1450nm within the SWIR band. By mounting the M5018-SW lens on an automated conveyor sorting system, organic produce can be scanned to map water distribution and bruising.
Problem SolvedEnables sorting systems to identify bruised, rotting, or dehydrated fruit before visible exterior blemishes occur. The wide F1.8 aperture allows maximum light transmission, permitting high-speed line scan operations under safe illumination levels.
Moisture Content MappingAgricultural Produce SortingWater Absorption BandHyperspectral GradingHigh-Speed Conveyor Sorting
3. Industrial Defogging and Haze Penetration Surveillance
Short-wave infrared wavelengths scatter much less than visible light when passing through small environmental particles like haze, steam, and thick fog. This compact lens is deployed in rugged security enclosures across maritime docks, oil refineries, and chemical plants.
Problem SolvedMaintains critical facility visibility and process safety tracking during heavy fog or steam leaks. The integrated manual focus and iris locking screws prevent shifting due to constant heavy industrial vibrations and outdoor wind loads.
DefoggingEnvironmental Particle ScatteringVibration ResistanceRefinery Process MonitoringLong-Range SWIR Surveillance
