Computar Lens TEC-M10110MP Telecentric Lens

USD 1,199.00

This 2MP telecentric C-mount lens offers 1.0x magnification, a 111.5mm working distance, and -0.003% distortion for precise optical inspection.

SKU Computar-TEC-M10110MP Category
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Computar Lens TEC-M10110MP Telecentric Lens

Model Identifier TEC-M10110MP
Official Part Number TEC-M10110MP
GTIN Standard NA

Technical Overview

This 2MP telecentric C-mount lens offers 1.0x magnification, a 111.5mm working distance, and -0.003% distortion for precise optical inspection.

Key Features

  • Telecentric optical design for high-resolution images with the lowest possible geometrical distortion [1.1].
  • Fully compatible with 2MP machine vision sensors on up to 2/3" cameras.
  • Provides an exact 1.0x optical magnification for 1:1 image mapping.
  • Optimized for a highly precise 111.5mm working distance.
  • Ultra-low TV distortion rated at -0.003% to guarantee strict dimensional accuracy.
  • Compact industrial design (φ30mm x 126.7mm) weighing only 105g with a standard C-Mount interface.

Ultra-Low Distortion Telecentric Optics (-0.003%)

Technical Specification Matrix

ParameterValue
MountC-Mount [1.5]
Max Image Format2/3" (φ11mm)
Magnification1.0X
Working Distance111.5mm
Effective F Number10.1
Depth of Field0.82mm
Resolving Power6.9μm
TV Distortion (2/3 type)-0.003%
Back Focal Length17.0mm
Flange Back Length17.526mm
Operating Temperature-10°C to +50°C
Physical Weight (kg)0.11
Dimensions L x W x H (cm)12.67 x 3 x 3

Industrial Applications

1. AutomatedOpticalInspection(AOI)

Verifyinghigh-densityPCBcomponentsusingthe1.0xmagnificationandtelecentricopticstomaintainabsolutemeasurementintegrityacrossthesensorfield[1.1].

Problem Solved

Perspective errors in standard entocentric lenses cause false dimension failures on flat components. Telecentricity solves this by eliminating parallax.

AOITelecentricTV DistortionMachine Vision

2. Precision Machining Metrology

Inspecting tight-tolerance micro-machined parts from exactly 111.5mm away, ensuring precise sub-millimeter measurements with -0.003% distortion.

Problem Solved

Standard lenses shift apparent object dimensions if part depth slightly varies on the inspection line, ruining exact metrology measurements.

MetrologyWorking DistanceDistortionC-Mount

3. Semiconductor Wafer Alignment

Providing consistent, high-contrast imaging of fiducial markers on silicon wafers by leveraging the 0.82mm depth of field and 6.9μm resolving power.

Problem Solved

Tiny Z-axis height fluctuations during wafer positioning can defocus alignment markers or shift their apparent X/Y coordinates in conventional lenses.

SemiconductorWafer AlignmentResolving PowerDepth of Field
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